Higher-Order Wavelet Statistics and their Application to Digital Forensics

H. Farid and S. Lyu

IEEE Workshop on Statistical Analysis in Computer Vision (in conjunction with CVPR), Madison, Wisconsin, 2003

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We describe a statistical model for natural images that is built upon a multi-scale wavelet decomposition. The model consists of first- and higher-order statistics that capture certain statistical regularities of natural images. We show how this model can be useful in several digital forensic applications, specifically in detecting various types of digital tampering.