Metric Measurements on a Plane from a Single Image

M.K. Johnson and H. Farid

Technical Report, TR2006-579, Dartmouth College, Computer Science

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The past decade has seen considerable advances in the application of principles from projective geometry to problems in image analysis and computer vision. In this paper, we review a subset of this work, and leverage these results for the purpose of forensic analysis. Specifically, we review three techniques for making metric measurements on planar surfaces from a single image. The resulting techniques should prove useful in forensic settings where real-world measurements are required.