BIB-VERSION:: CS-TR-v2.0
ID:: ncstrl.dartmouthcs//TR2006-579
ENTRY:: August 10, 2006
ORGANIZATION:: Dartmouth College, Computer Science
TITLE:: Metric Measurements on a Plane from a Single Image
TYPE:: Technical Report (paper)
REVISION:: 1
AUTHOR:: Johnson, Micah K.
AUTHOR:: Farid, Hany
DATE:: August 2006
RETRIEVAL:: For a paper copy, email <reports@cs.dartmouth.edu>
RETRIEVAL:: For a paper copy, write to
       Technical Report Librarian
       Department of Computer Science
       Dartmouth College
       6211 Sudikoff Laboratory
       Hanover, NH 03755-3510
       USA
RETRIEVAL:: PDF at http://www.cs.dartmouth.edu/reports/TR2006-579.pdf
ABSTRACT:: 
The past decade has seen considerable advances in the application of
principles from projective geometry to problems in image analysis and
computer vision.  In this paper, we review a subset of this work, and
leverage these results for the purpose of forensic analysis.
Specifically, we review three techniques for making metric
measurements on planar surfaces from a single image.  The resulting
techniques should prove useful in forensic settings where real-world
measurements are required.
END:: ncstrl.dartmouthcs//TR2006-579