@TechReport{Dartmouth:TR2006-579,
  author = {Micah K. Johnson and Hany Farid},
  title = {{Metric Measurements on a Plane from a Single Image}},
  institution = {Dartmouth College, Computer Science},
  address = {Hanover, NH},
  number = {TR2006-579},
  year = {2006},
  month = {August},
  URL = {http://www.cs.dartmouth.edu/reports/TR2006-579.pdf},
  abstract = {
    The past decade has seen considerable advances in the application of
    principles from projective geometry to problems in image analysis and
    computer vision.  In this paper, we review a subset of this work, and
    leverage these results for the purpose of forensic analysis.
    Specifically, we review three techniques for making metric
    measurements on planar surfaces from a single image.  The resulting
    techniques should prove useful in forensic settings where real-world
    measurements are required.
  }
}