%T Metric Measurements on a Plane from a Single Image
%A Micah K. Johnson
%A Hany Farid
%R Technical Report TR2006-579
%I Dartmouth College, Computer Science
%C Hanover, NH
%D August 2006
%U http://www.cs.dartmouth.edu/reports/TR2006-579.pdf
%X
 The past decade has seen considerable advances in the application of
 principles from projective geometry to problems in image analysis and
 computer vision.  In this paper, we review a subset of this work, and
 leverage these results for the purpose of forensic analysis.
 Specifically, we review three techniques for making metric
 measurements on planar surfaces from a single image.  The resulting
 techniques should prove useful in forensic settings where real-world
 measurements are required.