Dartmouth logo Dartmouth College Computer Science
Technical Report series
CS home
TR home
TR search TR listserv
By author: A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
By number: 2017, 2016, 2015, 2014, 2013, 2012, 2011, 2010, 2009, 2008, 2007, 2006, 2005, 2004, 2003, 2002, 2001, 2000, 1999, 1998, 1997, 1996, 1995, 1994, 1993, 1992, 1991, 1990, 1989, 1988, 1987, 1986

A Metric Towards Efficient Exhaustive Test Pattern Generation
Dimitrios Kagaris, Fillia Makedon
Dartmouth PCS-TR91-162

Abstract:

A viable technique [7] in built-in self-test (BIST)[2] is to generate test patterns pseudo-exhaustively by using linear feedback shift registers (LFSR's). The goal is to find an appropriate primitive polynomial of degree d that will generat 2d test patterns in order to exercise all circuit outputs simultaneously. In an attempt to reduce the degree d of the polynomial the following strategy was proposed in [6,5]. In the first phase, partition the circuit into segments by inserting a small number of register cells, so that the input dependency of any circuit element in the segments is no more than d. Then, obain an appropriate primitive polynomial of degree d by inserting additional register cells. In [12] we have proposed a heuristic for phase one that does not necessarily partition the circuit. Extensive experimentation has shown that this results in a considerably smaller cell overhead.

In this paper we extend our heuristic in [12], so that the minimization of the number of register cells is done in conjunction with a quantity that naturally reflects the difficulty of deriving an appropriate primitive polynomial of degree d. Experimentation shows that the proposed heuristic results again in an overall smaller number of register cells than a partition based approach and in an efficient framework for test pattern generation.


PDF PDF (548KB)

Bibliographic citation for this report: [plain text] [BIB] [BibTeX] [Refer]

Or copy and paste:
   Dimitrios Kagaris and Fillia Makedon, "A Metric Towards Efficient Exhaustive Test Pattern Generation." Dartmouth Computer Science Technical Report PCS-TR91-162, 1991.


Notify me about new tech reports.

Search the technical reports.

To receive paper copy of a report, by mail, send your address and the TR number to reports AT cs.dartmouth.edu


Copyright notice: The documents contained in this server are included by the contributing authors as a means to ensure timely dissemination of scholarly and technical work on a non-commercial basis. Copyright and all rights therein are maintained by the authors or by other copyright holders, notwithstanding that they have offered their works here electronically. It is understood that all persons copying this information will adhere to the terms and constraints invoked by each author's copyright. These works may not be reposted without the explicit permission of the copyright holder.

Technical reports collection maintained by David Kotz.