Metric Measurements on a Plane from a Single Image
| Type of publication: | Techreport |
| Citation: | johnson-farid-tr-06 |
| Number: | TR2006-579 |
| Year: | 2006 |
| Institution: | Department of Computer Science, Dartmouth College |
| URL: | http://www.cs.dartmouth.edu/fa... |
| Abstract: | The past decade has seen considerable advances in the application of principles from projective geometry to problems in image analysis and computer vision. In this paper, we review a subset of this work, and leverage these results for the purpose of forensic analysis. Specifically, we review three techniques for making metric measurements on planar surfaces from a single image. The resulting techniques should prove useful in forensic settings where real-world measurements are required. |
| Keywords: | |
| Authors | |
| Added by: | [ADM] |
| Total mark: | 0 |
|
Attachments
|
|
|
|
|
Code
|
|
|
|
|
|
Data
|
|
|
|
|
|
Notes
|
|
|
|
|
