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The past decade has seen considerable advances in the application of
principles from projective geometry to problems in image analysis and
computer vision. In this paper, we review a subset of this work, and
leverage these results for the purpose of forensic analysis.
Specifically, we review three techniques for making metric
measurements on planar surfaces from a single image. The resulting
techniques should prove useful in forensic settings where real-world
measurements are required.
Bibliographic citation for this report: [plain text] [BIB] [BibTeX] [Refer]
Or copy and paste:
Micah K. Johnson and Hany Farid, "Metric Measurements on a Plane from a Single Image." Dartmouth Computer Science Technical Report TR2006-579, August 2006.
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